[BlueOnyx:13733] Re: old raq550 question
Stephanie Sullivan
ses at aviaweb.com
Tue Sep 24 12:28:21 -05 2013
Yes - look how many times you see "pre-fail"... This is a strong warning in
my experience that a drive failure will be happening. If I were you I'd
remove the drive raid thinks has failed and put a new one in. Then when the
rebuild/clone is completed, replace the other one too. Both look very iffy
to me.
-Stephanie
> -----Original Message-----
> From: webmaster [mailto:webmaster at oldcabin.net]
> Sent: Tuesday, September 24, 2013 1:13 PM
> To: BlueOnyx General Mailing List
> Subject: [BlueOnyx:13732] Re: old raq550 question
>
>
>
> had to install smartctl before I could run these
>
> Below are snips from running "smartctl -a /dev/hda" and then
> "smartctl -a /dev/hdc"
>
> Anyone see anything indicating a bad drive?
>
>
>
>
>
>
> [root smartmontools-5.32]# ./smartctl -a /dev/hda
>
> smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen
> Home page is http://smartmontools.sourceforge.net/
>
> === START OF INFORMATION SECTION ===
> Device Model: ST380021A
> Serial Number: 3HV4PLF1
> Firmware Version: 3.19
> Device is: In smartctl database [for details use: -P show]
> ATA Version is: 5
> ATA Standard is: Exact ATA specification draft version not indicated
> Local Time is: Tue Sep 24 12:09:29 2013 CDT
> SMART support is: Available - device has SMART capability.
> SMART support is: Enabled
>
> === START OF READ SMART DATA SECTION ===
> SMART overall-health self-assessment test result: PASSED
>
> General SMART Values:
> Offline data collection status: (0x82) Offline data collection
> activity
> was completed without error.
> Auto Offline Data
> Collection:
> Enabled.
> Self-test execution status: ( 0) The previous self-test
> routine
> completed
> without error or no self-
> test
> has ever
> been run.
> Total time to complete Offline
> data collection: ( 422) seconds.
> Offline data collection
> capabilities: (0x1b) SMART execute Offline
> immediate.
> Auto Offline data collection
> on/off support.
> Suspend Offline collection
> upon new
> command.
> Offline surface scan
> supported.
> Self-test supported.
> No Conveyance Self-test
> supported.
> No Selective Self-test
> supported.
> SMART capabilities: (0x0003) Saves SMART data before
> entering
> power-saving mode.
> Supports SMART auto save
> timer.
> Error logging capability: (0x01) Error logging supported.
> No General Purpose Logging
> support.
> Short self-test routine
> recommended polling time: ( 1) minutes.
> Extended self-test routine
> recommended polling time: ( 57) minutes.
>
> SMART Attributes Data Structure revision number: 10
> Vendor Specific SMART Attributes with Thresholds:
> ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
> WHEN_FAILED RAW_VALUE
> 1 Raw_Read_Error_Rate 0x000f 080 070 034 Pre-fail
> Always - 130575369
> 3 Spin_Up_Time 0x0003 070 070 000 Pre-fail
> Always - 0
> 4 Start_Stop_Count 0x0032 100 100 020 Old_age
> Always - 2
> 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail
> Always - 5
> 7 Seek_Error_Rate 0x000f 086 060 030 Pre-fail
> Always - 434973384
> 9 Power_On_Hours 0x0032 008 008 000 Old_age
> Always - 81257
> 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail
> Always - 0
> 12 Power_Cycle_Count 0x0032 100 100 020 Old_age
> Always - 135
> 194 Temperature_Celsius 0x0022 030 049 000 Old_age
> Always - 30
> 195 Hardware_ECC_Recovered 0x001a 080 070 000 Old_age
> Always - 130575369
> 197 Current_Pending_Sector 0x0012 100 100 000 Old_age
> Always - 1
> 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age
> Offline - 1
> 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age
> Always - 0
> 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age
> Offline - 0
> 202 TA_Increase_Count 0x0032 100 253 000 Old_age
> Always - 0
>
> SMART Error Log Version: 1
> ATA Error Count: 46 (device log contains only the most recent five
> errors)
> CR = Command Register [HEX]
> FR = Features Register [HEX]
> SC = Sector Count Register [HEX]
> SN = Sector Number Register [HEX]
> CL = Cylinder Low Register [HEX]
> CH = Cylinder High Register [HEX]
> DH = Device/Head Register [HEX]
> DC = Device Command Register [HEX]
> ER = Error register [HEX]
> ST = Status register [HEX]
> Powered_Up_Time is measured from power on, and printed as
> DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
> SS=sec, and sss=millisec. It "wraps" after 49.710 days.
>
> Error 46 occurred at disk power-on lifetime: 15719 hours (654 days +
> 23
> hours)
> When the command that caused the error occurred, the device was
> active or idle.
>
> After command completion occurred, registers were:
> ER ST SC SN CL CH DH
> -- -- -- -- -- -- --
> 40 51 4d 43 f0 b9 e0 Error: UNC 77 sectors at LBA = 0x00b9f043 =
> 12185667
>
> Commands leading to the command that caused the error were:
> CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
> -- -- -- -- -- -- -- -- ---------------- --------------------
> c8 00 80 10 f0 b9 e0 00 06:10:53.611 READ DMA
> c8 00 80 90 ef b9 e0 00 06:10:53.578 READ DMA
> c8 00 80 10 ef b9 e0 00 06:10:53.569 READ DMA
> c8 00 80 90 ee b9 e0 00 06:10:53.561 READ DMA
> c8 00 80 10 ee b9 e0 00 06:10:53.553 READ DMA
>
> Error 45 occurred at disk power-on lifetime: 15716 hours (654 days +
> 20
> hours)
> When the command that caused the error occurred, the device was
> active or idle.
>
> After command completion occurred, registers were:
> ER ST SC SN CL CH DH
> -- -- -- -- -- -- --
> 40 51 4d 43 f0 b9 e0 Error: UNC 77 sectors at LBA = 0x00b9f043 =
> 12185667
>
> Commands leading to the command that caused the error were:
> CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
> -- -- -- -- -- -- -- -- ---------------- --------------------
> c8 00 80 10 f0 b9 e0 00 03:26:14.529 READ DMA
> c8 00 80 90 ef b9 e0 00 03:26:14.501 READ DMA
> c8 00 80 10 ef b9 e0 00 03:26:14.493 READ DMA
> c8 00 80 90 ee b9 e0 00 03:26:14.484 READ DMA
> c8 00 80 10 ee b9 e0 00 03:26:14.476 READ DMA
>
> Error 44 occurred at disk power-on lifetime: 15715 hours (654 days +
> 19
> hours)
> When the command that caused the error occurred, the device was
> active or idle.
>
> After command completion occurred, registers were:
> ER ST SC SN CL CH DH
> -- -- -- -- -- -- --
> 40 51 4d 43 f0 b9 e0 Error: UNC 77 sectors at LBA = 0x00b9f043 =
> 12185667
>
> Commands leading to the command that caused the error were:
> CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
> -- -- -- -- -- -- -- -- ---------------- --------------------
> c8 00 80 10 f0 b9 e0 00 00:36:30.173 READ DMA
> c8 00 80 90 ef b9 e0 00 00:36:30.142 READ DMA
> c8 00 80 10 ef b9 e0 00 00:36:30.134 READ DMA
> c8 00 80 90 ee b9 e0 00 00:36:30.126 READ DMA
> c8 00 80 10 ee b9 e0 00 00:36:30.118 READ DMA
>
> Error 43 occurred at disk power-on lifetime: 15712 hours (654 days +
> 16
> hours)
> When the command that caused the error occurred, the device was
> active or idle.
>
> After command completion occurred, registers were:
> ER ST SC SN CL CH DH
> -- -- -- -- -- -- --
> 40 51 4d 43 f0 b9 e0 Error: UNC 77 sectors at LBA = 0x00b9f043 =
> 12185667
>
> Commands leading to the command that caused the error were:
> CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
> -- -- -- -- -- -- -- -- ---------------- --------------------
> c8 00 80 10 f0 b9 e0 00 11:20:46.090 READ DMA
> c8 00 80 90 ef b9 e0 00 11:20:46.058 READ DMA
> c8 00 80 10 ef b9 e0 00 11:20:46.050 READ DMA
> c8 00 80 90 ee b9 e0 00 11:20:46.042 READ DMA
> c8 00 80 10 ee b9 e0 00 11:20:46.034 READ DMA
>
> Error 42 occurred at disk power-on lifetime: 15709 hours (654 days +
> 13
> hours)
> When the command that caused the error occurred, the device was
> active or idle.
>
> After command completion occurred, registers were:
> ER ST SC SN CL CH DH
> -- -- -- -- -- -- --
> 40 51 4d 43 f0 b9 e0 Error: UNC 77 sectors at LBA = 0x00b9f043 =
> 12185667
>
> Commands leading to the command that caused the error were:
> CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
> -- -- -- -- -- -- -- -- ---------------- --------------------
> c8 00 80 10 f0 b9 e0 00 08:30:44.510 READ DMA
> c8 00 80 90 ef b9 e0 00 08:30:44.477 READ DMA
> c8 00 80 10 ef b9 e0 00 08:30:44.469 READ DMA
> c8 00 80 90 ee b9 e0 00 08:30:44.461 READ DMA
> c8 00 80 10 ee b9 e0 00 08:30:44.453 READ DMA
>
> SMART Self-test log structure revision number 1
> No self-tests have been logged. [To run self-tests, use: smartctl -
> t]
>
>
> Device does not support Selective Self Tests/Logging
>
>
>
>
>
> #####################################################################
> #
>
>
>
> [root smartmontools-5.32]# ./smartctl -a /dev/hdc
>
> smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen
> Home page is http://smartmontools.sourceforge.net/
>
> === START OF INFORMATION SECTION ===
> Device Model: ST380021A
> Serial Number: 3HV4PDGT
> Firmware Version: 3.19
> Device is: In smartctl database [for details use: -P show]
> ATA Version is: 5
> ATA Standard is: Exact ATA specification draft version not indicated
> Local Time is: Tue Sep 24 12:10:11 2013 CDT
> SMART support is: Available - device has SMART capability.
> SMART support is: Enabled
>
> === START OF READ SMART DATA SECTION ===
> SMART overall-health self-assessment test result: PASSED
>
> General SMART Values:
> Offline data collection status: (0x82) Offline data collection
> activity
> was completed without error.
> Auto Offline Data
> Collection:
> Enabled.
> Self-test execution status: ( 0) The previous self-test
> routine
> completed
> without error or no self-
> test
> has ever
> been run.
> Total time to complete Offline
> data collection: ( 422) seconds.
> Offline data collection
> capabilities: (0x1b) SMART execute Offline
> immediate.
> Auto Offline data collection
> on/off support.
> Suspend Offline collection
> upon new
> command.
> Offline surface scan
> supported.
> Self-test supported.
> No Conveyance Self-test
> supported.
> No Selective Self-test
> supported.
> SMART capabilities: (0x0003) Saves SMART data before
> entering
> power-saving mode.
> Supports SMART auto save
> timer.
> Error logging capability: (0x01) Error logging supported.
> No General Purpose Logging
> support.
> Short self-test routine
> recommended polling time: ( 1) minutes.
> Extended self-test routine
> recommended polling time: ( 57) minutes.
>
> SMART Attributes Data Structure revision number: 10
> Vendor Specific SMART Attributes with Thresholds:
> ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
> WHEN_FAILED RAW_VALUE
> 1 Raw_Read_Error_Rate 0x000f 075 072 034 Pre-fail
> Always - 143743403
> 3 Spin_Up_Time 0x0003 070 070 000 Pre-fail
> Always - 0
> 4 Start_Stop_Count 0x0032 100 100 020 Old_age
> Always - 2
> 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail
> Always - 0
> 7 Seek_Error_Rate 0x000f 086 060 030 Pre-fail
> Always - 403284815
> 9 Power_On_Hours 0x0032 008 008 000 Old_age
> Always - 81240
> 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail
> Always - 0
> 12 Power_Cycle_Count 0x0032 100 100 020 Old_age
> Always - 135
> 194 Temperature_Celsius 0x0022 030 050 000 Old_age
> Always - 30
> 195 Hardware_ECC_Recovered 0x001a 075 072 000 Old_age
> Always - 143743403
> 197 Current_Pending_Sector 0x0012 100 100 000 Old_age
> Always - 0
> 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age
> Offline - 0
> 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age
> Always - 0
> 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age
> Offline - 0
> 202 TA_Increase_Count 0x0032 100 253 000 Old_age
> Always - 0
>
> SMART Error Log Version: 1
> No Errors Logged
>
> SMART Self-test log structure revision number 1
> No self-tests have been logged. [To run self-tests, use: smartctl -
> t]
>
>
> Device does not support Selective Self Tests/Logging
>
>
>
>
>
>
>
>
>
>
>
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